Abstract
In many applications, Internet of Things (IoT) are deployed to monitor events happening and developing in an area for a long term. This monitored area can be divided into several clusters in the data space formed by the monitored physical parameters. Each cluster covers several geographical patches in the area. The patches of the cluster with the highest possibility of developing an concerned event, called Area of Interest (AoI), are monitored heavily for a long term. Due to the power limits of IoT, multigenerational sensors are deployed consecutively. In this paper, we develop stochastic models for the reliability of multigenerational IoT and find the optimal strategies to deploy sensors to maximize this reliability. The theoretic models and analysis can be applied to myriad multigenerational systems.
| Original language | English |
|---|---|
| Title of host publication | IEEE International Conference on Electro Information Technology |
| Place of Publication | usa |
| Publisher | IEEE Computer [email protected] |
| Pages | 203-208 |
| Number of pages | 6 |
| Volume | 2018-May |
| ISBN (Electronic) | 9781538653982 |
| DOIs | |
| State | Published - Oct 18 2018 |
| Event | 2018 IEEE International Conference on Electro/Information Technology, EIT 2018 - Rochester, United States Duration: May 3 2018 → May 5 2018 |
Conference
| Conference | 2018 IEEE International Conference on Electro/Information Technology, EIT 2018 |
|---|---|
| Country/Territory | United States |
| City | Rochester |
| Period | 05/3/18 → 05/5/18 |
Keywords
- Cluster
- IoT
- Lineage
- Multigenerational
- Patch
- Reliability
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