TY - JOUR
T1 - Determination of magnetic exchange stiffness and surface anisotropy constants in epitaxial (formula presented) films
AU - Talagala, P.
AU - Fodor, Petru S
AU - Haddad, D.
AU - Naik, R.
AU - Wenger, L. E.
AU - Vaishnava, P. P.
AU - Naik, V. M.
PY - 2002/1/1
Y1 - 2002/1/1
N2 - Magnetic characteristics of epitaxial (formula presented) (formula presented) 0.16, and 0.50) films with nominal 200 nm thickness on Cu(001)/Si(100) substrates have been investigated by magnetization and ferromagnetic resonance measurements in order to better clarify the rationale for the large variation in the magnetic exchange stiffness constant A, previously determined from different measurements. The exchange constant as well as the saturation magnetization, effective demagnetizing field, fourth-order magnetocrystalline, and second-order perpendicular uniaxial magnetic anisotropy fields has been determined. The analyses of low-temperature saturation magnetization data on these films yield A values that increase from (formula presented) for a pure Ni film to (formula presented) for the (formula presented) film. Furthermore, spin-wave resonance volume modes observed in (formula presented) and 0.16 films indicate that the surface plays a role in the exchange stiffness constant determination as the surface anisotropy constants are found to be approximately 1 and 4 (formula presented) respectively. The latter value is substantially larger than that for any other system reported so far. © 2002 The American Physical Society.
AB - Magnetic characteristics of epitaxial (formula presented) (formula presented) 0.16, and 0.50) films with nominal 200 nm thickness on Cu(001)/Si(100) substrates have been investigated by magnetization and ferromagnetic resonance measurements in order to better clarify the rationale for the large variation in the magnetic exchange stiffness constant A, previously determined from different measurements. The exchange constant as well as the saturation magnetization, effective demagnetizing field, fourth-order magnetocrystalline, and second-order perpendicular uniaxial magnetic anisotropy fields has been determined. The analyses of low-temperature saturation magnetization data on these films yield A values that increase from (formula presented) for a pure Ni film to (formula presented) for the (formula presented) film. Furthermore, spin-wave resonance volume modes observed in (formula presented) and 0.16 films indicate that the surface plays a role in the exchange stiffness constant determination as the surface anisotropy constants are found to be approximately 1 and 4 (formula presented) respectively. The latter value is substantially larger than that for any other system reported so far. © 2002 The American Physical Society.
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U2 - 10.1103/PhysRevB.66.144426
DO - 10.1103/PhysRevB.66.144426
M3 - Article
SN - 1098-0121
VL - 66
SP - 1
EP - 6
JO - Physical Review B - Condensed Matter and Materials Physics
JF - Physical Review B - Condensed Matter and Materials Physics
IS - 14
ER -