Abstract
We studied the growth and structure of C60 thin film condensed on NaCl, glass and mica substrates by transmission electron microscopy. Highly ordered, (111) textured and epitaxial thin films were obtained on (001) NaCl and mica respectively. Various deposition parameters including different substrate temperatures, deposition rates and film thicknesses were experimented with. The orientational order and nature of defects present in the films were assessed by electron diffraction, bright and dark field images. We ascribe the abnormal reflections in the electron diffraction patterns which had been thought by some workers to belong to the diffraction of an h.c.p. structure phase to the existence of stacking disorder in the f.c.c. structure. © 1993.
| Original language | English |
|---|---|
| Pages (from-to) | 149-153 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 232 |
| Issue number | 2 |
| DOIs | |
| State | Published - Sep 25 1993 |
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