Nonlinear resistivity and critical behavior of metal-overlayer percolation systems on epitaxial fullerene films

  • J. Wu
  • , W B Zhao
  • , J. Chen
  • , K. Wu
  • , Z. Wang
  • , J. L. Zhang
  • , C. Y. Li
  • , D. L. Yin
  • , Z. N. Gu
  • , Z. X. Jin
  • , X. H. Zhou

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Abstract

Fullerene ((Formula presented) and (Formula presented)) films were epitaxially grown on fresh (001) mica with the fcc closed-packed plane parallel to the substrate surface. Metal overlayers were deposited onto these fullerene films in an ultrahigh-vacuum chamber, and in situ resistance measurements were performed. With increasing current, we observed a reversible resistance variation and irreversible breakdown. Near the percolation threshold, we find the power law scaling behavior (Formula presented)∼(Formula presented), where (Formula presented) is the breakdown current and R the sample resistance. The exponent a is much smaller than the values given by previous experiments and the prediction of the conventional Nodes-Links-Blobs model. A possible explanation of these phenomena based on metal-fullerene interfacial interactions is discussed. © 1996 The American Physical Society.
Original languageEnglish
Pages (from-to)9840-9845
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume54
Issue number14
DOIs
StatePublished - Jan 1 1996

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