Abstract
By measuring the resistance in situ during the deposition of C60 on ultrathin metal layers in a UHV system, we find the resistance decreases sharply in most cases. This enhanced electronic transport in metal-C60 multilayers (bilayers), may be related to charge transfer from the metal to C60 and surface bonding effects, and hence can be used as a new possible approach for probing the interfacial interactions between C60 and metals. © 1994.
| Original language | English |
|---|---|
| Pages (from-to) | 100-105 |
| Number of pages | 6 |
| Journal | Chemical Physics Letters |
| Volume | 228 |
| Issue number | 1-3 |
| DOIs | |
| State | Published - Sep 30 1994 |
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