Variable-temperature scanning optical and force microscope

The development of a combined atomic force microscopy (AFM) and high resolution optical microscope, designed to independently acquire force and optical measurements over a wide temperature range and at high magnetic fields was analyzed. The capability of the microscope to simultaneously and independently perform force and optical measurements from room temperature down to 4 K was demonstrated. The scanning was performed using a compact XYZ stage, while the AFM and optical head are kept fixed, allowing scanning probe and optical measurements to be acquired simultaneously and in concert. The free optical axis of the microscope enables both reflection and transmission experiments to be performed.